![]() ![]() Copyright (2010), American Chemical Society.) Peaks at ∼406 and ∼400 eV in f-GNRs, respectively, indicate the presence of nitrophenyl groups and lower oxidation states, for example, NH 2 on the surface of the GNRs. N1s and C1s XPS spectra of functionalized (f-) and as-prepared GNRs. XPS has been used to identify metal impurities and the formation of carbides from CVD growth processes, estimating the thickness of epitaxial graphene, measuring oxide formation at the interface between epitaxial graphene and the SiC substrate, and detecting chemical attachment to graphene. XPS can provide quantitative information such as the number of layers, and identification of impurities present from patterning or processing. The surface sensitivity of XPS makes it a valuable tool in the study of graphene-since graphene is intrinsically only a few layers thick. The energy and intensity of these peaks enable identification and quantification of all surface elements present (except hydrogen). Surface atoms have characteristic peaks in the XPS spectrum. XPS analysis relating to the XPS spectra can be obtained by irradiating a sample with X-rays and measuring the kinetic energy of electrons that are emitted from the top 1–10 nm of the material being investigated. XPS is a surface science technique, which is routinely used to reveal information on the elemental composition, empirical formula, chemical state, and electronic state of the elements within a material. Walker, in Silicon Carbide Biotechnology (Second Edition), 2016 4.3.2 XPS ![]()
0 Comments
Leave a Reply. |
AuthorWrite something about yourself. No need to be fancy, just an overview. ArchivesCategories |